Abstract: As the standardization of 5G solidifies, researchers are speculating what 6G will be. The integration of sensing functionality is emerging as a key feature of the 6G Radio Access Network ...
Abstract: A latch-type comparator with a dynamic bias pre-amplifier is implemented in a 65-nm CMOS process. The dynamic bias with a tail capacitor is simple to implement and ensures that the ...
Abstract: Alternative vehicles, such as plug-in hybrid electric vehicles, are becoming more popular. The batteries of these plug-in hybrid electric vehicles are to be charged at home from a standard ...
Abstract: Distributed Denial of Service (DDoS) attacks are one of the most harmful threats in today's Internet, disrupting the availability of essential services. The challenge of DDoS detection is ...
Abstract: In this article, in order to optimize the dynamic performance of the permanent magnet synchronous motor (PMSM) speed regulation system, a nonlinear speed-control algorithm for the PMSM ...
Abstract: The industrial Internet of Things (IoT) is a trend of factory development and a basic condition of intelligent factory. It is very important to ensure the security of data transmission in ...
Abstract: The propagation properties of the half-mode substrate integrated waveguide (HMSIW) are studied theoretically and experimentally in this paper. Two equivalent models of the HMSIW are ...
Abstract: Aerial manipulator, which is composed of an unmanned aerial vehicle (UAV) and a multilink manipulator and can perform aerial manipulation, has shown great potential of applications. However, ...
Abstract: This article introduces the design and imaging principles of the Advanced Hyperspectral Imager (AHSI) aboard China's GaoFen-5 satellite. The AHSI is a visible and nearinfrared ...
Abstract: We address the sparse signal recovery problem in the context of multiple measurement vectors (MMV) when elements in each nonzero row of the solution matrix are temporally correlated.
Abstract: The field of drug discovery has experienced a remarkable transformation with the advent of artificial intelligence (AI) and machine learning (ML) technologies. However, as these AI and ML ...
Abstract: Identification of the defective patterns of the wafer maps can provide insights for the quality control in the semiconductor wafer fabrication systems (SWFSs). In real SWFSs, the collected ...
Results that may be inaccessible to you are currently showing.
Hide inaccessible results